JPH0132700Y2 - - Google Patents
Info
- Publication number
- JPH0132700Y2 JPH0132700Y2 JP11954583U JP11954583U JPH0132700Y2 JP H0132700 Y2 JPH0132700 Y2 JP H0132700Y2 JP 11954583 U JP11954583 U JP 11954583U JP 11954583 U JP11954583 U JP 11954583U JP H0132700 Y2 JPH0132700 Y2 JP H0132700Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- pin
- sleeve
- pin body
- land
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 10
- 230000002265 prevention Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 description 10
- 238000007689 inspection Methods 0.000 description 5
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 5
- 238000005259 measurement Methods 0.000 description 3
- 239000007943 implant Substances 0.000 description 2
- 238000002513 implantation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11954583U JPS6029373U (ja) | 1983-07-30 | 1983-07-30 | コンタクトプロ−ブピン |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11954583U JPS6029373U (ja) | 1983-07-30 | 1983-07-30 | コンタクトプロ−ブピン |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6029373U JPS6029373U (ja) | 1985-02-27 |
| JPH0132700Y2 true JPH0132700Y2 (en]) | 1989-10-05 |
Family
ID=30274318
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11954583U Granted JPS6029373U (ja) | 1983-07-30 | 1983-07-30 | コンタクトプロ−ブピン |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6029373U (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0537437Y2 (en]) * | 1986-10-14 | 1993-09-21 |
-
1983
- 1983-07-30 JP JP11954583U patent/JPS6029373U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6029373U (ja) | 1985-02-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20150054539A1 (en) | Wiring board for testing loaded printed circuit board | |
| US7495464B2 (en) | Inspection device of a semiconductor device | |
| WO2018173448A1 (ja) | 電気的接続装置 | |
| JPH0132700Y2 (en]) | ||
| JP5451730B2 (ja) | プローブカード保持装置 | |
| JPH05302938A (ja) | プリント配線板の検査治具 | |
| JPH09321392A (ja) | プリント回路基板 | |
| JP3042035B2 (ja) | 回路基板検査装置 | |
| KR100273000B1 (ko) | 튜너의 수상 검사용 지그 | |
| JPH0329175B2 (en]) | ||
| JPH0563399A (ja) | 板状体の位置決め装置 | |
| KR200226390Y1 (ko) | 튜너의 수상 검사용 지그 | |
| JPH0656401B2 (ja) | 検査装置 | |
| KR100734256B1 (ko) | 칩분류 공정을 위한 퍼포먼스 보드의 검수 지그 | |
| JP3419078B2 (ja) | 直交孔ピッチ用限界ゲージ | |
| JP2968650B2 (ja) | 印刷配線板の検査方法 | |
| JPH05215802A (ja) | プリント配線板の検査治具 | |
| KR200421330Y1 (ko) | 전자회로 검사장치 | |
| KR20020089654A (ko) | 칩분류 공정을 위한 퍼포먼스 보드의 검수 지그 | |
| KR100647494B1 (ko) | 전자회로 검사장치 및 그 검사방법 | |
| JPH0611462Y2 (ja) | 基板検査用コンタクトプローブ | |
| JPH10190181A (ja) | プリント基板及びその検査方法 | |
| JPS6332256B2 (en]) | ||
| JP3727427B2 (ja) | 実装基板検査装置の基板位置決めピンの位置ズレ検出装置 | |
| KR19990030204U (ko) | 튜너의 수상 검사용 지그 |